GlossaryOriginSpecs

Glossary

SUT, DUT, CUT and AUT

SUT, DUT, CUT and AUT are the four levels at which a test result can be attributed: the Solution Under Test (the whole deployment), a Device Under Test (one product inside it), a Control Under Test (one rule or detection inside a device), and an Agent Under Test (an agent whose own conduct is being tested).

ProofJack Rating: Human 100% · AI 0% (self-estimated; Technical Marketing (2008) and PP-SPEC-077/078 AI_DISCLOSURE: hierarchy and AUT listed as human)

Also known as: Solution Under Test, Device Under Test, Control Under Test, Agent Under Test, test hierarchy

Mynted 2026-10-20 · Updated 2026-10-20

First used: DUT and SUT: Craig Thomas Ellrod, Technical Marketing (2008), ISBN 978-0-9822570-0-5, Chapter 4. CUT and AUT: PP-SPEC-077, October 2026.

The four levels

Level Term Scope Example
Solution SUT The full deployment under test A production agent stack with its network, identity and data stores
Device DUT One security product, configuration or guardrail inside the SUT An EDR, a WAF, an agent policy layer
Control CUT One control inside a DUT A single rule, policy, signature, detection or guardrail function
Agent AUT One agent inside the SUT whose own conduct is under test A coding agent, an MCP-connected assistant, one member of an agent swarm

An SUT contains one or more DUTs and any number of AUTs. A DUT contains one or more CUTs.

Devices stop attacks. Agents may commit them.

A DUT is a defender: the question is whether it stopped the attack. An AUT is an actor: the question is whether it stayed inside its Declared Policy. The same test harness can measure both, but they are different questions.

Credit to a single control is earned, not reported

A device log naming the rule that fired is not enough to credit that rule. A result can be attributed to a single CUT only by differential attribution: matched runs in an otherwise identical SUT, with that control active and with it disabled, using fresh variants of the same technique. The attack must land with the control off and fail with it on.

Where the terms come from

DUT and SUT come from the competitive test methodology in Craig Thomas Ellrod, Technical Marketing (2008), ISBN 978-0-9822570-0-5, Chapter 4, “Competitive Test”, which defines a competitive test as a device or solution under test together with the testing equipment. Its baseline practice of testing with and without the device is the basis for differential attribution. PP-SPEC-077 extends the model one level down (CUT) and one step sideways (AUT).

Related terms

Sources

Updated 2026-10-20